Robot | Path | Permission |
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Title | LayTec |
Description | LayTec – integrated metrology for advanced LayTec is a major provider of integrated metrology for thin-film deposition and other high value generating processes. LayTec’s equipment is used in a broad range of applications like optoelectronics, electronics, PV, displays, optics and photonics, |
Keywords | integrated metrology, in-situ metrology, in-line metrology, lab-line metrology, map-line metrology, thin-film deposition, real-time process monitoring, process optimization, epitaxial process optimization, yield improvement, compound semiconductors |
WebSite | laytec.de |
Host IP | 46.30.60.137 |
Location | Germany |
Site | Rank |
US$4,183,743
Last updated: 2022-09-05 00:28:31
laytec.de has Semrush global rank of 2,529,865. laytec.de has an estimated worth of US$ 4,183,743, based on its estimated Ads revenue. laytec.de receives approximately 482,740 unique visitors each day. Its web server is located in Germany, with IP address 46.30.60.137. According to SiteAdvisor, laytec.de is safe to visit. |
Purchase/Sale Value | US$4,183,743 |
Daily Ads Revenue | US$3,862 |
Monthly Ads Revenue | US$115,858 |
Yearly Ads Revenue | US$1,390,290 |
Daily Unique Visitors | 32,183 |
Note: All traffic and earnings values are estimates. |
Host | Type | TTL | Data |
laytec.de. | A | 10800 | IP: 46.30.60.137 |
laytec.de. | NS | 10800 | NS Record: ns01.agenturserver.co. |
laytec.de. | NS | 10800 | NS Record: ns01.agenturserver.it. |
laytec.de. | NS | 10800 | NS Record: ns01.agenturserver.de. |
laytec.de. | MX | 10800 | MX Record: 10 webmail.laytec.de. |
laytec.de. | TXT | 10800 | TXT Record: MS=ms33552055 |
laytec.de. | TXT | 10800 | TXT Record: v=spf1 include:agenturserver.de mx ip4:145.253.105.0/29 -all |
Search for: language English 한국어 日本語 简体中文 繁體中文 Sign in Newsletter Contact LayTec > Home Home Solutions Industries Optoelectronics VCSEL UV LEDs Quantum cascade lasers (QCL) Electronics Power and RF Electronics Photovoltaics c-Si c-Si back end CIGS CdTe CPV Perovskites Displays Others Processes Epitaxy IR pyrometry 3 wavelength reflectance In-situ wafer bow UV pyrometry Reflectance Anisotropy Spectroscopy ALD Sputter deposition Roll-to-roll CBD Materials III-Nitride based III-Nitride growth on silicon (Gan/Si) InP based GaAs based PSS Solar Cell Materials Advanced R&D Products In-situ Metrology EpiTT EpiCurve® TT Spectral Systems Pyro 400 AbsoluT NEPtune InspiRe EpiRAS In-line Metrology ILMetro X Link PearL & t-PearL EddyCus Flames At-line Metrology EpiX X Link off-line Software Solutions OEM Solutions Key Technologies Metrology Methods 3λ reflectance Spectroscopic R&T IR Pyrometry UV Pyrometry Deflectometry/Curvature measurement Photoluminescence Conductivity Reflectance Anisotropy |
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